- Recherche et sélection de publications
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A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation
- Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, Daisuke Fujimoto, Makoto Nagata, Toshihiro Katashita, Jean-Luc Danger #1, Takafumi Aoki
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| #1 |
Laboratoire Traitement et Communication de l'Information [Paris] (LTCI)
- Télécom ParisTech
- CNRS : UMR5141
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- References
- IEEE transactions on VLSI systems, August 2015,
- Abstract
- Keywords
- Category
- Article in peer reviewed Journal
- Research Area(s)
- Engineering Sciences/Electronics
- Identifier(s)
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DOI 10.1109/TVLSI.2014.2339892
Bibliographic key SE:IEEEVLSI-15
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- Last update
- on october 02, 2015
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