Probability Aware Fault-Injection Approach for SER Estimation

Fabio Batagin Armelin, Lirida Alves de Barros Naviner, Roberto d'Amore

References

Proceedings of IEEE Latin American Test Symposium (LATS), São Paulo, SP, Brazil, March 2018,

Abstract

Keywords

Category

Paper in proceedings

Research Area(s)

Engineering Sciences/Microelectronics

Identifier(s)

Bibliographic key FA:LATS-18b

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Last update

on april 12, 2018 by Lirida Alves De Barros Naviner