Impact of Aging on the Reliability of Delay PUFs

Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley

References

Journal of Electronic Testing, October 2018, vol. 34, n° 5, pp. 571--586

Abstract

Keywords

Category

Article in peer reviewed Journal

Research Area(s)

Computer Science/Cryptography and Security
Mathematics/Information Theory

Identifier(s)

DOI 10.1007/s10836-018-5745-6
Bibliographic key Karimi2018

Export

Last update

on october 01, 2018 by Jean-Luc Danger