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Probability Aware Fault-Injection Approach for SER Estimation

Fabio Batagin Armelin, Lirida Alves de Barros Naviner, Roberto d'Amore
References
Proceedings of IEEE Latin American Test Symposium (LATS), São Paulo, SP, Brazil, March 2018,
Abstract
Keywords
Category
Paper in proceedings
Research Area(s)
Engineering Sciences/Microelectronics
Identifier(s)
Bibliographic key FA:LATS-18b
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Last update
on april 12, 2018 by Lirida Alves De Barros Naviner


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