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Impact of Aging on the Reliability of Delay PUFs

Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley
References
Journal of Electronic Testing, October 2018, vol. 34, n° 5, pp. 571--586
Abstract
Keywords
Category
Article in peer reviewed Journal
Research Area(s)
Computer Science/Cryptography and Security
Mathematics/Information Theory
Identifier(s)
DOI 10.1007/s10836-018-5745-6
Bibliographic key Karimi2018
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Last update
on october 01, 2018 by Jean-Luc Danger


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